53:52

MOS Parameter Extraction from I-V Characteristics

59:20

SOI Technology and comparisons with Bulk Silicon CMOS technology

58:47

Ideal MOS C-V Characteristics

59:21

Subthreshold Conduction

1:00:14

CMOS Scaling Theory

57:23

Drain Induced Barrier Lowering

1:25:49

Silicon Carbide Electronics

1:15:41

108N. MOS Capacitor: Energy band diagram, accumulation, depletion, and inversion, threshold voltage