Vertical GaN on foreign substrates: The YESvGaN approach - Christian Huber (Bosch)
30:02
Reliability and stability of SiC devices: New dynamic robustness tests - Tobias Reimann (ISLE)
22:00
Russland: Enthüllungen über einen verbotenen Handel | Mit offenen Daten | ARTE
40:49
Wide band gap power transistors for electrified mobility - Klaus Heyers (Bosch)
16:06
"Russische Streitkräfte verlieren über 1000 Soldaten pro Tag" - Militär-Strategieexperte Remmel
55:07
Reliability and stability of GaN devices - Nicolò Zagni (IUNET-UNIMORE)
29:14
Elektrik I - Olmaz Öyle Saçma Bilim - Prof. Erkcan Özcan - B08
1:16:52
Dr. Peter Knittel - "Tailored Diamond Films for Quantum Technologies by CVD growth"
1:21:08