LEC- 26: Bright field, Dark field & Phase contrast mode in TEM
44:35
LEC- 27: Applications of Scanning Electron Microscopy (SEM)
45:57
LEC- 22: Microscopy & Metallography (Prof. B.S Murthy)
46:14
LEC- 17: Fundamentals of Electron Microscopes (Part 1)
1:17:11
LEC- 33: Case Studies on Material Characterization
24:18
China's Semiconductor Breakthrough: EUV-FEL Light Source, BEUV & Nanoimprint Technology Podcast
22:29
Microsoft Announces World's First Topological Quantum Chip - Majorana 1 Explained
47:47
WHAT LIES BEYOND The Edge of the Universe?
30:52