21:22

FEI Tecnai F20 S/TEM: gun alignment

41:32

FEI Tecnai F20 S/TEM: basic operation in TEM mode

56:35

Lec 18 - Indexing Diffraction Pattern

42:16

FEI Tecnai F20 S/TEM: convergent beam electron diffraction (CBED)

0:50

[Materials] Automated Diffraction Pattern Analysis of TiO2 nanoparticles

1:36:55

From TEM to STEM: The Scanning Transmission Electron Microscopy Revolution (MSA webinar)

7:18

TEM practical session 06 - Acquiring diffraction patterns and tilting a crystal to a zone axis

1:00:12

FEI Talos F200i S/TEM: basic operation (playthrough)