FEI Helios PFIB CXe dual FIB/SEM: in-situ UHR-SEM imaging of a FIB-prepared cross-section
19:27
FEI Helios PFIB CXe dual FIB/SEM: full system reboot from standby
39:45
Focused Ion Beam S/TEM Lamella Prep Tutorial
1:36:55
From TEM to STEM: The Scanning Transmission Electron Microscopy Revolution (MSA webinar)
23:40
50,000,000x Magnification
22:05
DIY Scanning Laser Microscope
2:00
Focused Ion Beam preparation of TEM lamella
29:15
Preparation of Particulate Samples for S/TEM Analysis
57:03