Stylus Profilometer (Bruker DektakXTA)
39:49
AFM (Nanosurf Drive) topography, phase imaging and indentation demonstration
28:40
SEM (Hitachi SU3500) sample loading and imaging
21:36
SEM (Hitachi SU3500) EDS operating procedure
59:25
X-ray Diffraction: Putting the “structure” in structure-property-function relationships
24:19
Advanced Multilayer PCB Electro-Magnetic Simulation, AWR Microwave Office Tutorial 3
7:06
Sputter coater (Cressington) 108auto/SE
47:59
COSINC Monthly Webinar 20240506 Introduction to Electron Beam Lithography
15:25