PHI Webinar Series: Nanoscale Surface Sensitive Chemical Imaging of Additive Manufacturing Materials
43:33
PHI Webinar Series - XPS: Is it the Right Technique for Your Analytical Needs?
41:11
PHI Webinar Series: Recent Developments and Applications of Lab-based HAXPES Using a PHI Quantes XPS
59:39
An Introduction to Scanning Electron Microscopy and Focused Ion Beam (Matthew Bresin)
37:48
PHI Webinar Series: Surface Analysis of Modern High-Capacity Battery Materials
22:59
Le paradoxe du dôme : une faille dans les lois de Newton
15:25
Metal Alloys of the Future?
38:22
PHI Webinar Series: Advances in XPS Analysis of Battery Materials
37:48