Microscopy: Super-Resolution: Structured Illumination Microscopy (SIM) (David Agard)
26:30
Microscopy: Measuring Dynamics: Photobleaching and Photoactivation (JLS)
39:07
Microscopy: Deconvolution Microscopy (David Agard)
38:35
Microscopy: Super-Resolution: Overview and Stimulated Emission Depletion (STED) (Stefan Hell)
59:14
Structured Illumination Microscopy (SIM) fundamentals
31:29
Microscopy: Dark Field, Phase Contrast, Polarization and DIC (Edward Salmon)
27:18
Microscopy: Super-Resolution: Localization Microscopy (Bo Huang)
25:55
Microscopy: Diffraction (Jeff Lichtman)
22:59