FEI Themis Z S/TEM: Cs probe corrector tuning (IMPROVED)
1:09:03
FEI Themis Z S/TEM: STEM alignment and HAADF-STEM imaging (UPDATED)
1:15:52
FEI Themis Z S/TEM: Cs probe corrector tuning using SCORR
1:36:55
From TEM to STEM: The Scanning Transmission Electron Microscopy Revolution (MSA webinar)
29:01
FEI Themis Z S/TEM: diffraction pattern focusing and stigmating
2:00
Focused Ion Beam preparation of TEM lamella
32:52
Underappreciated and Very Useful: The Case for Microprobe-STEM
1:22:21
FEI Themis Z S/TEM: Condenser
20:38