How to Download, Install & Run WSxM Software for d analysis of Scanning Probe Microscopy (AFM) data
35:02
AFM: Six Must-Know Measurements
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How to do complete Rietveld Refinement of Double Phase BiNaTi-BaTiO3 material via FullProf Software
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Phase Identification with HighScore Plus
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Measuring nanoparticles with Gwyddion
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Beginners Guide to XPS Analysis with CasaXPS
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strain and dislocation density from XRD data - 14
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Atomic Force Microscopy (AFM)
31:10