46:10

FEI Tecnai F20 S/TEM: high-resolution imaging

2:06:22

Indexing TEM diffraction patterns from cubic single crystals

7:00

SAED, Selected Area Electron Diffraction Pattern: A Single Vs. Poly-crystalline Material

7:18

TEM practical session 06 - Acquiring diffraction patterns and tilting a crystal to a zone axis

19:46

MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example

10:36

18.2 - Diffraction pattern indexing and stereographic projection

32:52

Underappreciated and Very Useful: The Case for Microprobe-STEM

17:35

MSE585 F20 Lecture 20 Module 4 - TEM Selected-Area Diffraction